SAE Technical Paper Series [SAE International WCX™ 17: SAE World Congress Experience - (APR. 04, 2017)] SAE Technical Paper Series - Cybersecurity Testing and Validation
Wooderson, Paul; Ward, David
- 作者Wooderson, Paul; Ward, David
- 卷第1卷
- 印刷ISSNArra-y
- 文件大小633.10KB
- 发表时间2017
- DOI10.4271/2017-01-1655