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Generic distortion model for metrology under optical microscopes

Generic distortion model for metrology under optical microscopes

Liu, Xingjian; Li, Zhongwei; Zhong, Kai; Chao, YuhJin; Miraldo, Pedro; Shi, Yusheng
  • 期刊名称Optics and Lasers in Engineering
  • 作者Liu, Xingjian; Li, Zhongwei; Zhong, Kai; Chao, YuhJin; Miraldo, Pedro; Shi, Yusheng
  • 卷第103卷
  • 印刷ISSN0143-8166
  • 文件大小2326.79KB
  • 发表时间2018-04
  • DOI10.1016/j.optlaseng.2017.12.006
  • 页码119-126
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