Insights into the Failure Mechanisms of Organic Photodetectors
- 期刊名称Advanced Electronic Materials
- 作者Kielar, Marcin; Daanoune, Mehdi; François-Martin, Olivier; Flament, Bruno; Dhez, Olivier; Pandey, Ajay K.; Chambon, Sylvain; Clerc, Raphaël; Hirsch, Lionel
- 印刷ISSN2199-160X
- 文件大小1197.64KB
- 发表时间2018-01-12
- DOI10.1002/aelm.201700526
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