Short-Time Fourier Transform Based Transient Analysis of VSC Interfaced Point-to-Point DC System
Satpathi, Kuntal; Yeap, Yew Ming; Ukil, Abhisek; Geddada, Nagesh
- 期刊名称IEEE Transactions on Industrial Electronics
- 作者Satpathi, Kuntal; Yeap, Yew Ming; Ukil, Abhisek; Geddada, Nagesh
- 卷第65卷
- 期第5期
- 印刷ISSN0278-0046
- 电子ISSN1557-9948
- 文件大小3305.01KB
- 发表时间2018-5
- DOI10.1109/tie.2017.2758745
- 页码4080-4091