Experimental Validation of Fault Identification in VSC-Based DC Grid System
- 期刊名称IEEE Transactions on Industrial Electronics
- 作者Geddada, Nagesh; Yeap, Yew Ming; Ukil, Abhisek
- 卷第65卷
- 期第6期
- 印刷ISSN0278-0046
- 电子ISSN1557-9948
- 文件大小2713.40KB
- 发表时间2018-6
- DOI10.1109/TIE.2017.2767560
- 页码4799-4809
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