Time and Frequency Domain Fault Detection in VSC Interfaced Experimental DC Test System
- 期刊名称IEEE Transactions on Industrial Informatics
- 作者Yeap, Yew Ming; Geddada, Nagesh; Satpathi, Kuntal; Ukil, Abhisek
- 印刷ISSN1551-3203
- 电子ISSN1941-0050
- 文件大小8729.82KB
- 发表时间2018
- DOI10.1109/TII.2018.2796068
- 页码1-1