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Spectral artefacts post sputter-etching and how to cope with them – a case study of XPS on nitride-based coatings using monoatomic and cluster ion beams

Spectral artefacts post sputter-etching and how to cope with them – a case study of XPS on nitride-based coatings using monoatomic and cluster ion beams

Lewin, Erik; Counsell, Jonathan; Patscheider, Jörg
  • 期刊名称Applied Surface Science
  • 作者Lewin, Erik; Counsell, Jonathan; Patscheider, Jörg
  • 印刷ISSN0169-4332
  • 文件大小978.40KB
  • 发表时间2018-2
  • DOI10.1016/j.apsusc.2018.02.191
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