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Development of a TEM Compatible Nanowire Characterization Platform With Self-Forming Contacts

Moosavi, S. Hoda; Kroener, Michael; Frei, Maxi; Frick, Fabian; Kerzenmacher, Sven; Woias, Peter

期刊名称IEEE Transactions on Semiconductor Manufacturing
作者Moosavi, S. Hoda; Kroener, Michael; Frei, Maxi; Frick, Fabian; Kerzenmacher, Sven; Woias, Peter
卷第31卷
期第1期
印刷ISSN0894-6507
电子ISSN1558-2345
文件大小2034.46KB
发表时间2018-2
DOI10.1109/TSM.2018.2793356
页码22-31