A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors

• 期刊名称IEEE Transactions on Instrumentation and Measurement
• 作者Klosowski, M.; Jakusz, J.; Jendernalik, W.; Blakiewicz, G.; Szczepanski, S.; Koziel, S.
• 印刷ISSN0018-9456
• 电子ISSN1557-9662
• 文件大小1877.42KB
• 发表时间2018
• DOI10.1109/TIM.2018.2814118
• 页码1-10