[IEEE 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) - Pune, India (2018.1.6-2018.1.10)] 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID) - On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes
- 作者Kranthi, Nagothu Karmel; Mishra, Abhishek; Meersha, Adil; Shrivastava, Mayank
- 文件大小639.25KB
- 发表时间2018
- DOI10.1109/VLSID.2018.117
- 页码469-470
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