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Atomic-Scale Electronic Characterization of Defects in Silicon Car-bide Nanowires by Electron Energy Loss Spectroscopy

Atomic-Scale Electronic Characterization of Defects in Silicon Car-bide Nanowires by Electron Energy Loss Spectroscopy

Luna, Lunet E.; Gardner, David; Radmilovic, Velimir R.; Maboudian, Roya; Carraro, Carlo
  • 期刊名称The Journal of Physical Chemistry C
  • 作者Luna, Lunet E.; Gardner, David; Radmilovic, Velimir R.; Maboudian, Roya; Carraro, Carlo
  • 印刷ISSN1932-7447
  • 电子ISSN1932-7455
  • 文件大小468.41KB
  • 发表时间2018-05-10
  • DOI10.1021/acs.jpcc.8b01661
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