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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Defects affecting SiC power device reliability

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Defects affecting SiC power device reliability

Stahbush, R. E.; Mahadik, N. A.

作者Stahbush, R. E.; Mahadik, N. A.
文件大小288.90KB
发表时间2018
DOI10.1109/IRPS.2018.8353546

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