Mechanical Reliability of Flexible a-InGaZnO TFTs under Dynamic Stretch Stress

• 期刊名称IEEE Transactions on Electron Devices
• 作者Wang, Xialing; Wang, Mingxiang; Jiang, Wei; Zhang, Dongli; Wang, Huaisheng; Shan, Qi
• 印刷ISSN0018-9383
• 电子ISSN1557-9646
• 文件大小2727.31KB
• 发表时间2018
• DOI10.1109/TED.2018.2834228
• 页码1-7