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[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - The application of non-volatile look-up-table operations based on multilevel-cell of resistance switching random access memory

[IEEE 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2018.4.16-2018.4.19)] 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - The application of non-volatile look-up-table operations based on multilevel-cell of resistance switching random access memory

Zhang, Feng; Fan, Dong-Yu; Lin, Qi-Peng; Huo, Qiang; Li, Yun; Dai, Lan; Chen, Cheng-Ying; Shen, Hai-Hua
  • 作者Zhang, Feng; Fan, Dong-Yu; Lin, Qi-Peng; Huo, Qiang; Li, Yun; Dai, Lan; Chen, Cheng-Ying; Shen, Hai-Hua
  • 文件大小547.14KB
  • 发表时间2018
  • DOI10.1109/VLSI-DAT.2018.8373268
  • 页码1-4
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