[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs

• 作者Vallero, Alessandro; Tselonis, Sotiris; Gizopoulos, Dimitris; Di Carlo, Stefano
• 文件大小596.16KB
• 发表时间2018
• DOI10.1109/VTS.2018.8368665
• 页码1-6