Nondestructive testing method for a new generation of electronics
Azin, Anton; Zhukov, Andrey; Narikovich, Anton; Ponomarev, Sergey; Rikkonen, Sergey; Leitsin, Vladimir; Kopanitsa, N.O.; Ovsyannikova, T.Y.; Plevkov, V.S.; Klopotov, A.A.; Teplyakova, L.A.; Radchenko, P.A.
- 期刊名称MATEC Web of Conferences
- 作者Azin, Anton; Zhukov, Andrey; Narikovich, Anton; Ponomarev, Sergey; Rikkonen, Sergey; Leitsin, Vladimir; Kopanitsa, N.O.; Ovsyannikova, T.Y.; Plevkov, V.S.; Klopotov, A.A.; Teplyakova, L.A.; Radchenko, P.A.
- 卷第143卷
- 电子ISSN2261-236X
- 文件大小701.98KB
- 发表时间2018
- DOI10.1051/matecconf/201814304007