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[IEEE 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - ROMA, Italy (2018.5.22-2018.5.25)] 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Automated reduced order model generation for MEMS

[IEEE 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - ROMA, Italy (2018.5.22-2018.5.25)] 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Automated reduced order model generation for MEMS

Kriebel, David; Schmidt, Henry; Freitag, Markus; Mehner, Jan E.

作者Kriebel, David; Schmidt, Henry; Freitag, Markus; Mehner, Jan E.
文件大小1976.01KB
发表时间2018
DOI10.1109/dtip.2018.8394226
页码1-6

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