Selecting Functional Test Sequences for Defect Diagnosis

• 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
• 作者Pomeranz, Irith
• 印刷ISSN1063-8210
• 电子ISSN1557-9999
• 文件大小1361.36KB
• 发表时间2018
• DOI10.1109/TVLSI.2018.2849972
• 页码1-5