Generalized Completed Local Binary Patterns for Time-Efficient Steel Surface Defect Classification
Luo, Qiwu; Sun, Yichuang; Li, Pengcheng; Simpson, Oluyomi; Tian, Lu; He, Yigang
- 期刊名称IEEE Transactions on Instrumentation and Measurement
- 作者Luo, Qiwu; Sun, Yichuang; Li, Pengcheng; Simpson, Oluyomi; Tian, Lu; He, Yigang
- 印刷ISSN0018-9456
- 电子ISSN1557-9662
- 文件大小5272.87KB
- 发表时间2018
- DOI10.1109/TIM.2018.2852918
- 页码1-13