Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends
Kammerer, Jochen; Alkarsifi, Riva; Videlot-Ackermann, Christine; Margeat, Olivier; Schindler, Bernd; Wacker, Irene; Ackermann, Jorg; Schroder, Rasmus R; Pfannmoller, Martin
- 期刊名称Microscopy and Microanalysis
- 作者Kammerer, Jochen; Alkarsifi, Riva; Videlot-Ackermann, Christine; Margeat, Olivier; Schindler, Bernd; Wacker, Irene; Ackermann, Jorg; Schroder, Rasmus R; Pfannmoller, Martin
- 卷第24卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小597.15KB
- 发表时间2018-08
- DOI10.1017/S143192761800363X
- 页码628-629