[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Welcome to the ACC2018
Braatz, Richard D.; Berg, Jordan M.; Lin, Zongli; Allgower, Frank
- 作者Braatz, Richard D.; Berg, Jordan M.; Lin, Zongli; Allgower, Frank
- 文件大小121.39KB
- 发表时间2018
- DOI10.23919/ACC.2018.8430816
- 页码1-5