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A novel approach to surface defect detection

A novel approach to surface defect detection

Da, Yihui; Dong, Guirong; Wang, Bin; Liu, Dianzi; Qian, Zhenghua

期刊名称International Journal of Engineering Science
作者Da, Yihui; Dong, Guirong; Wang, Bin; Liu, Dianzi; Qian, Zhenghua
卷第133卷
印刷ISSN0020-7225
文件大小1289.11KB
发表时间2018-12
DOI10.1016/j.ijengsci.2018.09.005
页码181-195

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