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A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration

A Defect-Tolerant Reusable Network of DACs for Wafer-Scale Integration

Laflamme-Mayer, Nicolas; Kowarzyk, Gilbert; Blaquiere, Yves; Savaria, Yvon; Sawan, Mohamad
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Laflamme-Mayer, Nicolas; Kowarzyk, Gilbert; Blaquiere, Yves; Savaria, Yvon; Sawan, Mohamad
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小2906.32KB
  • 发表时间2018
  • DOI10.1109/TVLSI.2018.2876458
  • 页码1-12
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