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[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Impact of Process Imperfection of CNFET on Circuit-level Performance and Proposal to Improve Using Approximate Circuits

[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Impact of Process Imperfection of CNFET on Circuit-level Performance and Proposal to Improve Using Approximate Circuits

Wei, Lan; Sheikh, Kaship

作者Wei, Lan; Sheikh, Kaship
文件大小3028.85KB
发表时间2018
DOI10.1109/ICSICT.2018.8564809
页码1-4

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