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Impact of Sampling in the Operation of Vehicle to Grid and its Mitigation

Sah, Bikash; Kumar, Praveen; Rayudu, Ramesh; Bose, Sanjay Kumar; Inala, Krishna Pavan

期刊名称IEEE Transactions on Industrial Informatics
作者Sah, Bikash; Kumar, Praveen; Rayudu, Ramesh; Bose, Sanjay Kumar; Inala, Krishna Pavan
印刷ISSN1551-3203
电子ISSN1941-0050
文件大小1574.71KB
发表时间2018
DOI10.1109/TII.2018.2886633
页码1-1