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SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano
  • 期刊名称IEEE Transactions on Computers
  • 作者Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano
  • 印刷ISSN0018-9340
  • 电子ISSN1557-9956
  • 文件大小1194.00KB
  • 发表时间2018
  • DOI10.1109/TC.2018.2887225
  • 页码1-1
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