[IEEE 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Turin (2018.9.4-2018.9.7)] 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Advanced LLE Method for Dimension Reduction using Nonlinear Manufacturing Data
Xu, Sitong; Lu, Wen Feng; Li, Xiang; Lee, Kee Jin
- 作者Xu, Sitong; Lu, Wen Feng; Li, Xiang; Lee, Kee Jin
- 文件大小1143.58KB
- 发表时间2018
- DOI10.1109/etfa.2018.8502469
- 页码395-401