[IEEE 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Qingdao, China (2018.10.31-2018.11.3)] 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Research on Design and Test Method of High Performance 6 Input LUT

• 作者Zhang, Yufan; Pang, Yunbing; Xu, Jiqing; Tao, Xinxuan; Wang, Jian; Yang, Meng; Lai, Jinmei
• 文件大小6.61KB
• 发表时间2018
• DOI10.1109/ICSICT.2018.8564803
• 页码1-3