[IEEE 2018 9th International Conference on Computer Aided Design for Thin-Film Transistors (CAD-TFT) - Shenzhen, China (2018.11.16-2018.11.18)] 2018 9th Inthernational Conference on Computer Aided Design for Thin-Film Transistors (CAD-TFT) - Degradation of flexible LTPS TFTs under repetitive bending stress
Jiang, Wei; Shan, Qi; Wang, Huaisheng; Zhang, Dongli; Wang, Mingxiang
- 作者Jiang, Wei; Shan, Qi; Wang, Huaisheng; Zhang, Dongli; Wang, Mingxiang
- 文件大小5.08KB
- 发表时间2018
- DOI10.1109/CAD-TFT.2018.8608098
- 页码1-1