Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests
- 期刊名称CPSS Transactions on Power Electronics and Applications
- 作者Xu, Chi; Yang, Fei; Ugur, Enes; Pu, Shi; Akin, Bilal
- 卷第3卷
- 期第4期
- 印刷ISSN2475-742X
- 文件大小4097.15KB
- 发表时间2018-12
- DOI10.24295/CPSSTPEA.2018.00027
- 页码269-277
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