The sensitivity test of 2.45GHz RFID active tag
Shi, Xiaoli; Li, Runze; Shi, Xiaoli
- 期刊名称Journal of Physics: Conference Series
- 作者Shi, Xiaoli; Li, Runze; Shi, Xiaoli
- 卷第1087卷
- 印刷ISSN1742-6588
- 电子ISSN1742-6596
- 文件大小542.24KB
- 发表时间2018-09
- DOI10.1088/1742-6596/1087/5/052034