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[IEEE 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia) - Niigata (2018.5.20-2018.5.24)] 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) - New Screening Method for Improving Transient Current sharing of Paralleled SiC MOSFETs

[IEEE 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia) - Niigata (2018.5.20-2018.5.24)] 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) - New Screening Method for Improving Transient Current sharing of Paralleled SiC MOSFETs

Ke, Junji; Zhao, Zhibin; Sun, Peng; Huang, Huazhen; Abuogo, James; Cui, Xiang
  • 作者Ke, Junji; Zhao, Zhibin; Sun, Peng; Huang, Huazhen; Abuogo, James; Cui, Xiang
  • 文件大小2746.20KB
  • 发表时间2018
  • DOI10.23919/IPEC.2018.8507893
  • 页码1125-1130
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