The Impact of Correlated Metrics on the Interpretation of Defect Models
- 期刊名称IEEE Transactions on Software Engineering
- 作者Jiarpakdee, Jirayus; Tantithamthavorn, Chakkrit; Hassan, Ahmed E.
- 印刷ISSN0098-5589
- 电子ISSN1939-3520
- 文件大小4848.70KB
- 发表时间2019
- DOI10.1109/TSE.2019.2891758
- 页码1-1
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