Resolution-Enhancement for an Integral Imaging Microscopy Using Deep Learning

• 期刊名称IEEE Photonics Journal
• 作者Kwon, Ki-Chul; Kwon, Ki Hoon; Erdenebat, Munkh-Uchral; Piao, Yan-Ling; Lim, Young-Tae; Kim, Min Young; Kim, Nam
• 卷第11卷
• 期第1期
• 文件大小7281.48KB
• 发表时间2019-2
• DOI10.1109/jphot.2018.2890429
• 页码1-12