On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations

• 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
• 作者Javvaji, Pavan Kumar; Tragoudas, Spyros
• 印刷ISSN1063-8210
• 电子ISSN1557-9999
• 文件大小8.77KB
• 发表时间2019
• DOI10.1109/TVLSI.2019.2893844
• 页码1-10