Variability Expeditions: A Retrospective
- 期刊名称IEEE Design & Test
- 作者Gupta, Rajesh K.; Mitra, Subhasish; Gupta, Puneet
- 卷第36卷
- 期第1期
- 印刷ISSN2168-2356
- 电子ISSN2168-2364
- 文件大小5.80KB
- 发表时间2019-2
- DOI10.1109/MDAT.2018.2889103
- 页码65-67
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