发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO
<sub/>2</sub>
by Atom Probe Tomography

Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO ₂ by Atom Probe Tomography

Demoulin, Rémi; Roussel, Manuel; Duguay, Sébastien; Muller, Dominique; Mathiot, Daniel; Pareige, Philippe; Talbot, Etienne

期刊名称The Journal of Physical Chemistry C
作者Demoulin, Rémi; Roussel, Manuel; Duguay, Sébastien; Muller, Dominique; Mathiot, Daniel; Pareige, Philippe; Talbot, Etienne
印刷ISSN1932-7447
电子ISSN1932-7455
文件大小4302.34KB
发表时间2019-03-19
DOI10.1021/acs.jpcc.8b08620

← 返回【学霸图书馆】主页