Overview of Slope Monitoring Technology
Yang, Panpan; Wang, Nianqin; Jiang, Zhongyan; Yang, Yan; Yan, Heping
- 期刊名称IOP Conference Series: Materials Science and Engineering
- 作者Yang, Panpan; Wang, Nianqin; Jiang, Zhongyan; Yang, Yan; Yan, Heping
- 卷第472卷
- 电子ISSN1757-899X
- 文件大小132.32KB
- 发表时间2019-02-18
- DOI10.1088/1757-899X/472/1/012009