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Degradation mechanism of blue thermally activated delayed fluorescent organic light-emitting diodes under electrical stress

Degradation mechanism of blue thermally activated delayed fluorescent organic light-emitting diodes under electrical stress

Sohn, Jiho; Ko, Donghyun; Lee, Hyunho; Han, Jongseok; Lee, Sin-Doo; Lee, Changhee
  • 期刊名称Organic Electronics
  • 作者Sohn, Jiho; Ko, Donghyun; Lee, Hyunho; Han, Jongseok; Lee, Sin-Doo; Lee, Changhee
  • 印刷ISSN1566-1199
  • 文件大小2562.88KB
  • 发表时间2019-4
  • DOI10.1016/j.orgel.2019.04.033
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