![[IEEE 2014 IEEE International Joint Conference on Biometrics (IJCB) - Clearwater, FL, USA (2014.9.29-2014.10.2)] IEEE International Joint Conference on Biometrics - Theoretical vulnerability in likelihood-ratio-based biometric verification]()
[IEEE 2014 IEEE International Joint Conference on Biometrics (IJCB) - Clearwater, FL, USA (2014.9.29-2014.10.2)] IEEE International Joint Conference on Biometrics - Theoretical vulnerability in likelihood-ratio-based biometric verificationOhki, Tetsushi; Otsuka, Akira · 2014