Simulation of AlGaN/GaN HEMTs’ Breakdown Voltage Enhancement Using Gate Field-Plate, Source Field-Plate and Drain Field Plate
Liao, Biyan; Zhou, Quanbin; Qin, Jian; Wang, Hong
- 期刊名称Electronics
- 作者Liao, Biyan; Zhou, Quanbin; Qin, Jian; Wang, Hong
- 卷第8卷
- 期第4期
- 电子ISSN2079-9292
- 文件大小3451.70KB
- 发表时间2019-04-07
- DOI10.3390/electronics8040406