Ion Beam Induced Artifacts in Lead-Based Chalcogenides
Zhang, Xiaomi; Hao, Shiqiang; Tan, Gangjian; Hu, Xiaobing; Roth, Eric W.; Kanatzidis, Mercouri G.; Wolverton, Chris; Dravid, Vinayak P.
- 期刊名称Microscopy and Microanalysis
- 作者Zhang, Xiaomi; Hao, Shiqiang; Tan, Gangjian; Hu, Xiaobing; Roth, Eric W.; Kanatzidis, Mercouri G.; Wolverton, Chris; Dravid, Vinayak P.
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小761.62KB
- 发表时间2019-5-14
- DOI10.1017/S1431927619000503
- 页码1-9