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[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Fault Detection Effectiveness of Metamorphic Relations Developed for Testing Supervised Classifiers

[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Fault Detection Effectiveness of Metamorphic Relations Developed for Testing Supervised Classifiers

Saha, Prashanta; Kanewala, Upulee

作者Saha, Prashanta; Kanewala, Upulee
文件大小32.43KB
发表时间2019
DOI10.1109/AITest.2019.00019
页码157-164

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