Two-dimensional analytical modeling for electrical characteristics of Ge/Si SOI-tunnel FinFETs

Chander, S.; Baishya, S.; Kumar, S.; Singh, P.K.; Baral, K.; Tripathy, M.R.; Singh, A.K.; Jit, S.

期刊名称Superlattices and Microstructures
作者Chander, S.; Baishya, S.; Kumar, S.; Singh, P.K.; Baral, K.; Tripathy, M.R.; Singh, A.K.; Jit, S.
印刷ISSN0749-6036
文件大小942.89KB
发表时间2019-5
DOI10.1016/j.spmi.2019.05.037

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