[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology
- 作者Ji, Y.; Goo, H. J.; Lim, J.; Lee, S. B.; Lee, S.; Uemura, T.; Park, J. C.; Han, S. I.; Shin, S. C.; Lee, J. H.; Song, Y. J.; Lee, K. M.; Shin, H. M.; Hwang, S. H.; Seo, B. Y.; Lee, Y. K.; Kim, J. C.; Koh, G. H.; Park, K. C.; Pae, S.; Jeong, G. T.; Yoon, J. S.; Jung, E. S.
- 文件大小547.56KB
- 发表时间2019
- DOI10.1109/IRPS.2019.8720429
- 页码1-3
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