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[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Current Source Gate Drive to Reduce Switching Loss for SiC MOSFETs

[IEEE 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Anaheim, CA, USA (2019.3.17-2019.3.21)] 2019 IEEE Applied Power Electronics Conference and Exposition (APEC) - Current Source Gate Drive to Reduce Switching Loss for SiC MOSFETs

Gui, Handong; Zhang, Zheyu; Chen, Ruirui; Niu, Jiahao; Tolbert, Leon M.; Wang, Fred; Blalock, Benjamin J.; Costinett, Daniel J.; Choi, Benjamin B.
  • 作者Gui, Handong; Zhang, Zheyu; Chen, Ruirui; Niu, Jiahao; Tolbert, Leon M.; Wang, Fred; Blalock, Benjamin J.; Costinett, Daniel J.; Choi, Benjamin B.
  • 文件大小1832.17KB
  • 发表时间2019
  • DOI10.1109/APEC.2019.8722310
  • 页码972-978
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