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[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial Intelligence

[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial Intelligence

Augusto, Cristian; Moran, Jesus; De La Riva, Claudio; Tuya, Javier

作者Augusto, Cristian; Moran, Jesus; De La Riva, Claudio; Tuya, Javier
文件大小32.94KB
发表时间2019
DOI10.1109/AITest.2019.00011
页码103-110

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