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Modeling and Analysis of Signal Integrity of High-Speed Interconnected Channel with Degraded Contact Surface

Modeling and Analysis of Signal Integrity of High-Speed Interconnected Channel with Degraded Contact Surface

Wang, Ziren; Gao, Jinchun; Flowers, George T.; Wu, Yongle; Xie, Gang; Lv, Yinghua
  • 期刊名称IEEE Transactions on Components, Packaging and Manufacturing Technology
  • 作者Wang, Ziren; Gao, Jinchun; Flowers, George T.; Wu, Yongle; Xie, Gang; Lv, Yinghua
  • 印刷ISSN2156-3950
  • 电子ISSN2156-3985
  • 文件大小7.95KB
  • 发表时间2019
  • DOI10.1109/TCPMT.2019.2920918
  • 页码1-1
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