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Total internal reflection fluorescence pattern-illuminated Fourier ptychographic microscopy

Liu, Qiulan; Chen, Youhua; Liu, Wenjie; Han, Yubing; Cao, Ruizhi; Zhang, Zhimin; Kuang, Cuifang; Liu, Xu

期刊名称Optics and Lasers in Engineering
作者Liu, Qiulan; Chen, Youhua; Liu, Wenjie; Han, Yubing; Cao, Ruizhi; Zhang, Zhimin; Kuang, Cuifang; Liu, Xu
卷第123卷
印刷ISSN0143-8166
文件大小4414.37KB
发表时间2019-12
DOI10.1016/j.optlaseng.2019.06.023
页码45-52