Failure analysis of runway centerline light and effect of microstructure on mechanical properties
Su, Yue; Yu, Feng-Hu; Han, Qi-Nan; Shang, Yi-Bo; Rui, Shao-Shi; Li, Jian; Shi, Hui-Ji; Niu, Li-Sha
- 期刊名称Engineering Failure Analysis
- 作者Su, Yue; Yu, Feng-Hu; Han, Qi-Nan; Shang, Yi-Bo; Rui, Shao-Shi; Li, Jian; Shi, Hui-Ji; Niu, Li-Sha
- 卷第105卷
- 印刷ISSN1350-6307
- 文件大小4113.91KB
- 发表时间2019-11
- DOI10.1016/j.engfailanal.2019.07.051
- 页码1069-1078